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    題名: 透過型電子顕微鏡のための標本調製
    作者: ホシー, ヨン フォン;チュ, チン スン;シャルマ, プラディープ;コ, ユ フォン;ヤン, チュン シ;タイ, リン アイ;チェン, ユ チン;ティン, シャオ チュン
    貢獻者: Institute of Biomedical Engineering and Nanomedicine
    摘要: A TEM specimen kit is disclosed, which comprises: (a) a top substrate and a bottom substrate, the top and the bottom substrates being transparent and substantially parallel to each other; (b) a first spacer and a second spacer, located beneath the top substrate and sitting on the bottom substrate, the second spacer being opposite to and spaced apart from the first spacer at a distance of d; and (c) a chamber formed between the top and bottom substrate and between the first and second spacer, the chamber having two ends open to the atmosphere and characterized by having a height defined by the thickness h of the spacer, wherein the height being smaller than the diameter of a red blood cell. Also enclosed are methods for preparing a dry specimen for TEM nanoparticle characterization, and methods for analyzing TEM images of nanoparticles in a liquid sample.
    日期: 2018-03-20
    關聯: JP6297551/2018-03-20
    Link to: https://tiponet.tipo.gov.tw/gpss2/gpsskmc/gpssbkm?!!FRURLJP6297551B2
    顯示於類別:[楊重熙] 專利

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